OGI Systems Group is launching ClearEX ultimate and most advanced system to detect inclusions. The new device will be launched at the India Gem & Jewellery Machinery Expo 2014.

Following extensive research and development, OGI Systems successfully developed a unique technology for detection and mapping of internal features in rough diamonds. The ClearEX can scan most rough diamonds and accurately detect all the inclusions in the stone.

OGI continues to lead the market with breakthrough technology and provide its customers with the best solutions.

We invite you to visit us during IGJME Expo Booth 97 and see the ClearEX power.